Hönig, D., Schneider, S., Domnick, R., Belzner, M., Beck, U., Hertwig, A., Stephanowitz, R. and Weise, M. 2013. Optical Layer Systems for Product Authentication:Interference, Scattering, Light Diffusion and Ellipsometric Encoding as Public, Hidden and Forensic Security Features . International Conference on Plasma Surface Engineering. 2, 13 (Mar. 2013), 177–180. DOI:https://doi.org/10.3384/wcc2.177-180.