HÖNIG, D.; SCHNEIDER, S.; DOMNICK, R.; BELZNER, M.; BECK, U.; HERTWIG, A.; STEPHANOWITZ, R.; WEISE, M. Optical Layer Systems for Product Authentication:Interference, Scattering, Light Diffusion and Ellipsometric Encoding as Public, Hidden and Forensic Security Features . International Conference on Plasma Surface Engineering, [S. l.], v. 2, n. 13, p. 177–180, 2013. DOI: 10.3384/wcc2.177-180. Disponível em: https://wcc.ep.liu.se/index.php/PSE/article/view/423. Acesso em: 26 apr. 2024.